Genetic mapping of common bunt resistance and plant height QTL in wheat.

Singh, A., Knox, R.E., DePauw, R.M., Singh, A.K., Cuthbert, R.D., Kumar, S., and Campbell, H.L. (2016). "Genetic mapping of common bunt resistance and plant height QTL in wheat.", Theoretical and Applied Genetics (TAG), 129(2), pp. 243-256. doi : 10.1007/s00122-015-2624-8  Access to full text


Common bunt, also known as stinking smut, is caused by seed borne fungi Tilletia tritici (Bjerk.) Wint. [syn. Tilletia caries (DC.) Tul.] and Tilletia laevis Kühn [syn. Tilletia foetida (Wallr.) Liro.]. Common bunt is known to cause grain yield and quality losses in wheat due to bunt ball formation and infestation of the grain. The objectives of this research were to identify and map quantitative trait loci (QTL) for common bunt resistance, to study the epistatic interactions between the identified QTL, and investigate the co-localization of bunt resistance with plant height. A population of 261 doubled haploid lines from the cross Carberry/AC Cadillac and checks were genotyped with polymorphic genome wide microsatellite and DArT® markers. The lines were grown in 2011, 2012, and 2013 in separate nurseries for common bunt incidence and height evaluation. AC Cadillac contributed a QTL ( for common bunt resistance on chromosome 6D at markers XwPt-1695, XwPt-672044, and XwPt-5114. Carberry contributed QTL for bunt resistance on chromosomes 1B ( at XwPt743523) 4B ( at XwPt-744434-Xwmc617), 4D ( at XwPt-9747), 5B ( at XtPt-3719) and 7D ( at Xwmc273). Significant epistatic interactions were identified for percent bunt incidence between × and ×, and QTL by environment interaction between × Plant height QTL were found on chromosomes 4B ( and 6D ( that co-located with bunt resistance QTL. The identification of previously unreported common bunt resistance QTL (on chromosomes 4B, 4D and 7D), and new understanding of QTL × QTL interactions will facilitate marker-assisted breeding for common bunt resistance. Key message: Breeding for field resistance to common bunt in wheat will need to account for multiple genes and epistatic and QTL by environment interactions. Loci associated with quantitative resistance to common bunt are co-localized with other beneficial traits including plant height and rust resistance.

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